Spectral Thickness Gauge • MS-09

MS-09 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.

SKU: ms-09 Categories: , Tags: ,

Description

Technical parameters

ModelProject MS-09
Collimation hole Φ0.5mm Φ0.2mm Φ0.1mm
Measure the element range Cl(17)-U(92)
Coating analysis range Cl(17)-U(92) Li(3)-U(92)
EFP algorithm Standard
Analysis software Simultaneous analysis of 5 platings and 10 elements Simultaneous analysis of 23 plating layers, 24 elements
The ability to detect the same element in different layers No Standard
Software Operation Humanized closed software, automatically judge fault prompt correction and operation steps, to avoid misoperation
X-ray device Microfocus ray tube Microfocus enhanced ray tube
Low light focusing technology Diffusion of the nearest ranging spot 10%
Measure distance With distance compensation function, the measurement distance can be changed to measure concave and convex shaped samples, and the zoom distance can reach 0-30mm
Sample observation 1/2.7″color CCD, zoom function
Focus method Highly sensitive lens, manual focus
Magnification Optical 38-46X, digital magnification 40-200x
Instrument dimensions 550mm×360mm×410mm
Sample chamber dimensions 435mm×330mm×140mm
The sample stage moves No mobile platform (optional) High precision XY manual slide
Movable range 50mm*50mm
Weight 45KG 48KG
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